ADNAN K, 2019, J BIG DATA-GER, V6, DOI 10.1186/S40537-019-0254-8;AHMED I, 2020, IEEE INTERNET THINGS, V7, P5737, DOI 10.1109/JIOT.2019.2951365;AL-RAHMI W, 2019, DATA BRIEF, V22, P118, DOI 10.1016/J.DIB.2018.11.139;AL-RAHMI WM, 2018, IEEE ACCESS, V6, P14268, DOI 10.1109/ACCESS.2018.2802325;ALBLAWI AS, 2017, 2017 IEEE CONFERENCE ON BIG DATA AND ANALYTICS (ICBDA), P124, DOI 10.1109/ICBDAA.2017.8284118;ALEXANDRON G, 2019, INT J ARTIF INTELL E, V29, P484, DOI 10.1007/S40593-019-00183-1;ALHAZZANI NOURA, 2020, SOC SCI HUMANIT OPEN, V2, P100030, DOI 10.1016/J.SSAHO.2020.100030;ALJARALLAH S, 2018, PROCEEDINGS OF THE 12TH ACM/IEEE INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2018), DOI 10.1145/3239235.3239240;ALJAWARNEH SA, 2020, FOUND SCI, V25, P1147, DOI 10.1007/S10699-019-09594-8;ALJAWARNEH SA, 2020, J COMPUT HIGH EDUC, V32, DOI 10.1007/S12528-019-09207-0;AMADO A, 2018, EUR RES MANAG BUS EC, V24, P1, DOI 10.1016/J.IEDEEN.2017.06.002;ANSHARI M, 2016, EDUC INF TECHNOL, V21, P1663, DOI 10.1007/S10639-015-9407-3;BEN AYED A, 2015, PROCEDIA COMPUT SCI, V53, P216, DOI 10.1016/J.PROCS.2015.07.297;BHATHAL GS, 2019, ARRAY, V1, P1, DOI 10.1016/J.ARRAY.2019.100002, DOI 10.1016/J.ARRAY.2019.100002;BOGARIN A, 2018, WIRES DATA MIN KNOWL, V8, DOI 10.1002/WIDM.1230;BORISYUK F, 2018, KDD'18: PROCEEDINGS OF THE 24TH ACM SIGKDD INTERNATIONAL CONFERENCE ON KNOWLEDGE DISCOVERY & DATA MINING, P71, DOI 10.1145/3219819.3219861;BRADY K. A., 2015, P 2 2015 ACM C LEARN, P335, DOI 10.1145/2724660.2728687, DOI 10.1145/2724660.2728687;BROOKER A, 2018, AUSTRALAS J EDUC TEC, V34, P73, DOI 10.14742/AJET.3237;CHEN L, 2014, ADV MATER RES-SWITZ, V1046, P444, DOI 10.4028/WWW.SCIENTIFIC.NET/AMR.1046.444;CHEN NS, 2020, INTERACT LEARN ENVIR, V28, P142, DOI 10.1080/10494820.2019.1635395;CHENGCHENG NING, 2017, 2017 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO: WORKSHOPS (ICMEW), P549, DOI 10.1109/ICMEW.2017.8026312;CHERUVU A., 2019, P NAT ACAD SCI, P1, DOI 10.1145/3330431.3330459;CINBIS RG, 2017, IEEE T PATTERN ANAL, V39, P189, DOI 10.1109/TPAMI.2016.2535231;CONOLE G, 2013, RED-REV EDUC DISTANC;DANIEL, 2017, CURRENT THEORY PRACT, DOI 10.1007/978-3-319-06520-5, DOI 10.1007/978-3-319-06520-5;DANIEL B.K., 2017, BIG DATA LEARNING AN, P1, DOI 10.1007/978-3-319-06520-5_1, DOI 10.1007/978-3-319-06520-5_1;FOLTYNEK T, 2020, INT J EDUC TECHNOL H, V17, DOI 10.1186/S41239-020-00192-4;FOX R, 2016, EDUC ASIA PAC REG-IS, V33, P159, DOI 10.1007/978-981-10-0431-5_8;GALLAGHER SE, 2016, J COMPUT HIGH EDUC, V28, P358, DOI 10.1007/S12528-016-9124-Y;GANDOMI A, 2015, INT J INFORM MANAGE, V35, P137, DOI 10.1016/J.IJINFOMGT.2014.10.007;GARCIA-MARTINEZ C, 2019, J COMPUT ASSIST LEAR, V35, P110, DOI 10.1111/JCAL.12316;GIL-JAURENA I, 2016, INT J EDUC TECHNOL H, V13, DOI 10.1186/S41239-016-0016-Z;GUPTA A, 2016, PROC CVPR IEEE, P2315, DOI 10.1109/CVPR.2016.254;GUPTA KP, 2020, INTERACT TECHNOL SMA, V17, P355, DOI 10.1108/ITSE-06-2019-0033;HA I, 2015, INT J DISTRIB SENS N, DOI 10.1155/2015/417502;HAMAD MM., 2017, HIGHER ED STUDIES, V7, P7, DOI 10.5539/HES.V7N2P7;HE KM, 2016, PROC CVPR IEEE, P770, DOI 10.1109/CVPR.2016.90;HE WH, 2017, IEEE I CONF COMP VIS, P745, DOI 10.1109/ICCV.2017.87;HONE KS, 2016, COMPUT EDUC, V98, P157, DOI 10.1016/J.COMPEDU.2016.03.016;HOWARTH JP, 2016, INT J LIFELONG EDUC, V35, P74, DOI 10.1080/02601370.2015.1122667;HU H, 2017, IEEE I CONF COMP VIS, P4950, DOI 10.1109/ICCV.2017.529;HUANG LQ, 2017, INT J INFORM MANAGE, V37, P84, DOI 10.1016/J.IJINFOMGT.2016.12.002;JIE ZQ, 2017, PROC CVPR IEEE, P4294, DOI 10.1109/CVPR.2017.457;KELLY, 2017, J LEARNING ANAL, V4, P36, DOI 10.18608/JLA.2017.42.5, DOI 10.18608/JLA.2017.42.5;KHALIL M, 2017, J COMPUT HIGH EDUC, V29, P114, DOI 10.1007/S12528-016-9126-9;KINTU MJ, 2017, INT J EDUC TECHNOL H, V14, DOI 10.1186/S41239-017-0043-4;KONG YQ, 2019, J VIS COMMUN IMAGE R, V59, P215, DOI 10.1016/J.JVCIR.2019.01.024;KRIZKOVA S, 2016, IEEE INT FUZZY SYST, P1760, DOI 10.1109/FUZZ-IEEE.2016.7737903;LARA JA, 2020, J COMPUT HIGH EDUC, V32, DOI 10.1007/S12528-019-09235-W;LI K, 2019, COMPUT EDUC, V132, P16, DOI 10.1016/J.COMPEDU.2019.01.003;LI LY, 2019, APPL SCI-BASEL, V9, DOI 10.3390/APP9040688;LIU MS, 2018, PROC CVPR IEEE, P5686, DOI 10.1109/CVPR.2018.00596;LIU YL, 2017, PROC CVPR IEEE, P3454, DOI 10.1109/CVPR.2017.368;LU W, 2018, IEEE ACCESS, V6, P40198, DOI 10.1109/ACCESS.2018.2851942;MA, 2018, P INT C DIST ED LEAR, V1, P98, DOI 10.1145/3231848.3231856;MA JQ, 2018, IEEE T MULTIMEDIA, V20, P3111, DOI 10.1109/TMM.2018.2818020;MANGAROSKA K, 2019, IEEE T LEARN TECHNOL, V12, P516, DOI 10.1109/TLT.2018.2868673;MARQUEZ-VERA C, 2016, EXPERT SYST, V33, P107, DOI 10.1111/EXSY.12135;MI F, 2015, 2015 IEEE INTERNATIONAL CONFERENCE ON DATA MINING WORKSHOP (ICDMW), P256, DOI 10.1109/ICDMW.2015.174;MILLIGAN C, 2017, INT REV RES OPEN DIS, V18, P92, DOI 10.19173/IRRODL.V18I2.3033;MIRZA A, 2018, PROCEEDINGS OF THE 2ND MEDITERRANEAN CONFERENCE ON PATTERN RECOGNITION AND ARTIFICIAL INTELLIGENCE (MEDPRAI-2018), P70, DOI 10.1145/3177148.3180098;OLIVE DM, 2020, J COMPUT HIGH EDUC, V32, DOI 10.1007/S12528-019-09230-1;MOORE RL, 2021, J COMPUT HIGH EDUC, V33, P121, DOI 10.1007/S12528-020-09258-8;MORENO A, 2016, INT J INTERACT MULTI, V3, P57, DOI 10.9781/IJIMAI.2016.369;MURINO V, 2017, COMPUT VIS IMAGE UND, V156, P1, DOI 10.1016/J.CVIU.2017.01.007;OH EG, 2020, J COMPUT HIGH EDUC, V32, P455, DOI 10.1007/S12528-019-09243-W;OI M, 2017, SEVENTH INTERNATIONAL LEARNING ANALYTICS & KNOWLEDGE CONFERENCE (LAK'17), P536, DOI 10.1145/3027385.3029445;PAN L., 2017, P INT JOINT C NAT LA, P875;PARTILA, 2018, INT C INT HUM SYST I, P42;NGUYEN PX, 2014, IEEE WINT CONF APPL, P776, DOI 10.1109/WACV.2014.6836024;POELLHUBER B, 2019, INT REV RES OPEN DIS, V20, P221;POZON-LOPEZ I, 2021, J COMPUT HIGH EDUC, V33, P85, DOI 10.1007/S12528-020-09257-9;QIU JZ, 2016, PROCEEDINGS OF THE NINTH ACM INTERNATIONAL CONFERENCE ON WEB SEARCH AND DATA MINING (WSDM'16), P93, DOI 10.1145/2835776.2835842;RABIN E, 2019, INT J EDUC TECHNOL H, V16, DOI 10.1186/S41239-019-0144-3;RADHAKRISHNA V, 2017, DATABASE SYST J, V7, P22;RADHAKRISHNA V, 2018, ACM INT CONF PR SER, DOI 10.1145/3234698.3234742;RADHAKRISHNA V, 2018, MULTIMED TOOLS APPL, V77, P17643, DOI 10.1007/S11042-017-5185-9;RADHAKRISHNA V, 2017, 2017 INTERNATIONAL CONFERENCE ON ENGINEERING & MIS (ICEMIS);RADHAKRISHNA V, 2017, IADIS-INT J COMPUT S, V12, P126;RADHAKRISHNA V, 2017, IADIS-INT J COMPUT S, V12, P45;RAO, 2019, ADV DECISION SCI IMA, V4, P719, DOI 10.1007/978-3-030-24318-0_82, DOI 10.1007/978-3-030-24318-0_82;REDMON J, 2016, PROC CVPR IEEE, P779, DOI 10.1109/CVPR.2016.91;REIDENBERG JR, 2018, THEORY RES EDUC, V16, P263, DOI 10.1177/1477878518805308;REN SQ, 2015, ADV NEUR IN, V28;RIZVI S, 2020, J COMPUT HIGH EDUC, V32, DOI 10.1007/S12528-019-09231-0;RODRIGUEZ P., 2012, 2012 SIXTH INTERNATIONAL CONFERENCE ON COMPLEX, INTELLIGENT, AND SOFTWARE INTENSIVE SYSTEMS (CISIS), P887, DOI 10.1109/CISIS.2012.192;RUIZ-PALMERO J, 2020, SOC SCI-BASEL, V9, DOI 10.3390/SOCSCI9040053;SAYAHI S, 2014, 2014 6TH INTERNATIONAL CONFERENCE OF SOFT COMPUTING AND PATTERN RECOGNITION (SOCPAR), P418, DOI 10.1109/SOCPAR.2014.7008043;SHANG HF, 2019, J COMPUT HIGH EDUC, V31, P105, DOI 10.1007/S12528-018-9193-1;SHI MJ, 2016, LECT NOTES COMPUT SC, V9909, P105, DOI 10.1007/978-3-319-46454-1_7;SIGALOV SE, 2017, EDUC INF TECHNOL, V22, P2959, DOI 10.1007/S10639-016-9564-Z;SIMONYAN K., 2014, VERY DEEP CONVOLUTIO, DOI DOI 10.1109/CVPR.2015.7298594;SRINIVASAN S., 2018, INT J ENG TECHNOLOGY, V7, P195, DOI 10.14419/IJET.V7I2.33.13885, DOI 10.14419/IJET.V7I2.33.13885;SUJATHA R., 2018, INT J ED DEV USING I, V14, P62;TIAN S, 2018, IEEE T PATTERN ANAL, V40, P542, DOI 10.1109/TPAMI.2017.2692763;TIAN Z, 2016, LECT NOTES COMPUT SC, V9912, P56, DOI 10.1007/978-3-319-46484-8_4;WALLER MA, 2013, J BUS LOGIST, V34, P77, DOI 10.1111/JBL.12010;WANG J, 2018, INT C PATT RECOG, P2416, DOI 10.1109/ICPR.2018.8546088;WANG L, 2018, ICMR '18: PROCEEDINGS OF THE 2018 ACM INTERNATIONAL CONFERENCE ON MULTIMEDIA RETRIEVAL, P160, DOI 10.1145/3206025.3206051;XING WL, 2019, DISTANCE EDUC, V40, P98, DOI 10.1080/01587919.2018.1553560;XING WL, 2015, COMPUT HUM BEHAV, V47, P168, DOI 10.1016/J.CHB.2014.09.034;XU XF, 2020, IEEE T IND ELECTRON, V67, P2326, DOI 10.1109/TIE.2019.2903774;XU Y, 2018, SIGNAL PROCESS-IMAGE, V60, P131, DOI 10.1016/J.IMAGE.2017.09.013;YADEGARIDEHKORDI E., 2020, INT J EDUC TECHNOL H;YE YB, 2018, IEEE INT CONF BIG DA, P2373, DOI 10.1109/BIGDATA.2018.8622129;YIN C, 2018, KNOWL MANAG E-LEARN, V10, P455;ZHAO Y, 2017, LECT NOTES COMPUT SC, V10474, P330, DOI 10.1007/978-3-319-66610-5_24;ZHENG SY, 2019, INT J EMERG TECHNOL, V14, P125, DOI 10.3991/IJET.V14I08.10404;ZHONG ZY, 2017, INT CONF ACOUST SPEE, P1208, DOI 10.1109/ICASSP.2017.7952348;ZHOU K, 2016, DESTECH TRANS COMP;ZHOU XY, 2017, PROC CVPR IEEE, P2642, DOI 10.1109/CVPR.2017.283